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"Reliability improvement of InGaN LED backlight module by accelerated life ..."
Jae-Seong Jeong, Jin-Kyu Jung, Sang-Deuk Park (2008)
- Jae-Seong Jeong, Jin-Kyu Jung, Sang-Deuk Park:
Reliability improvement of InGaN LED backlight module by accelerated life test (ALT) and screen policy of potential leakage LED. Microelectron. Reliab. 48(8-9): 1216-1220 (2008)
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