"Efficient parametric yield optimization of VLSI circuit by uniform design ..."

Ming-e Jing et al. (2005)

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DOI: 10.1016/J.MICROREL.2004.06.001

access: closed

type: Journal Article

metadata version: 2025-04-23

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Ming-e Jing, Yue Hao, Jinfeng Zhang, Peijun Ma:
Efficient parametric yield optimization of VLSI circuit by uniform design sampling method. Microelectron. Reliab. 45(1): 155-162 (2005)

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