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"Design for Small Delay Test - A Simulation Study."

Matthias Kampmann, Sybille Hellebrand (2018)

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DOI: 10.1016/J.MICROREL.2017.11.019

access: closed

type: Journal Article

metadata version: 2020-02-22

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Matthias Kampmann, Sybille Hellebrand:
Design for Small Delay Test - A Simulation Study. Microelectron. Reliab. 80: 124-133 (2018)

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