"The radiation test based assessment of process quality and reliability for ..."

Leonid Kessarinskiy et al. (2016)

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DOI: 10.1016/J.MICROREL.2016.07.082

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type: Journal Article

metadata version: 2022-10-02

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Leonid Kessarinskiy, Georgii Davydov, Dmitry Boychenko, A. S. Artamonov, Alexander Nikiforov, I. B. Yashanin:
The radiation test based assessment of process quality and reliability for conventional 65-nm CMOS technology. Microelectron. Reliab. 64: 130-133 (2016)

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