"Experimental and numerical investigations on delayed short-circuit failure ..."

Zoubir Khatir, Stéphane Lefebvre, F. Saint-Eve (2007)

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DOI: 10.1016/J.MICROREL.2006.05.004

access: closed

type: Journal Article

metadata version: 2020-02-22

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Zoubir Khatir, Stéphane Lefebvre, F. Saint-Eve:
Experimental and numerical investigations on delayed short-circuit failure mode of single chip IGBT devices. Microelectron. Reliab. 47(2-3): 422-428 (2007)

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