"Negative bias illumination stress instability in amorphous InGaZnO thin ..."

Sang Min Kim et al. (2017)

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DOI: 10.1016/J.MICROREL.2017.06.020

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type: Journal Article

metadata version: 2022-04-21

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Sang Min Kim, Min-Soo Kang, Won-Ju Cho, Jong Tae Park:
Negative bias illumination stress instability in amorphous InGaZnO thin film transistors with ITO local conducting buried layer. Microelectron. Reliab. 76-77: 327-332 (2017)

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