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"Reliability studies of vertical GaN devices based on bulk GaN substrates."

Isik C. Kizilyalli et al. (2015)

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DOI: 10.1016/J.MICROREL.2015.07.012

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/KizilyalliBDBA15
Isik C. Kizilyalli, P. Bui-Quang, Don Disney, H. Bhatia, Ozgur Aktas:
Reliability studies of vertical GaN devices based on bulk GaN substrates. Microelectron. Reliab. 55(9-10): 1654-1661 (2015)

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