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"Stability of thin film resistors - Prediction and differences base on ..."

Reiner W. Kuehl (2009)

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DOI: 10.1016/J.MICROREL.2008.10.013

access: closed

type: Journal Article

metadata version: 2020-02-22

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Reiner W. Kuehl:
Stability of thin film resistors - Prediction and differences base on time-dependent Arrhenius law. Microelectron. Reliab. 49(1): 51-58 (2009)

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