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"Reliability of high voltage/high power L/S-band Hbt technology."

Benoit Lambert et al. (2010)

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DOI: 10.1016/J.MICROREL.2010.07.105

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/LambertJBOMDTFBM10
Benoit Lambert, G. Jonsson, J. Bataille, C. Ollivier, P. Mezenge, H. Derewonko, H. Thomas, D. Floriot, Hervé Blanck, C. Moreau:
Reliability of high voltage/high power L/S-band Hbt technology. Microelectron. Reliab. 50(9-11): 1543-1547 (2010)

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