"Evolution of LF noise in Power PHEMT's submitted to RF and DC Step Stresses."

Benoit Lambert et al. (2001)

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DOI: 10.1016/S0026-2714(01)00186-X

access: closed

type: Journal Article

metadata version: 2020-02-22

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Benoit Lambert, Nathalie Malbert, Nathalie Labat, Frédéric Verdier, André Touboul, P. Huguet, R. Bonnet, G. Pataut:
Evolution of LF noise in Power PHEMT's submitted to RF and DC Step Stresses. Microelectron. Reliab. 41(9-10): 1573-1578 (2001)

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