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"Reliability data's of 0.5 μm AlGaN/GaN on SiC technology qualification."

Benoit Lambert et al. (2012)

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DOI: 10.1016/J.MICROREL.2012.06.098

access: closed

type: Journal Article

metadata version: 2022-02-04

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  - https://dblp.org/rec/journals/mr/LambertTBSBJBMGOFB12
Benoit Lambert, Jim Thorpe, Reza Behtash, Bernd Schauwecker, Franck Bourgeois, Helmut Jung, Joëlle Bataille, Patrick Mezenge, Cyril Gourdon, Catherine Ollivier, Didier Floriot, Hervé Blanck:
Reliability data's of 0.5 μm AlGaN/GaN on SiC technology qualification. Microelectron. Reliab. 52(9-10): 2200-2204 (2012)

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