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"Experimental characterization and modelling of electromigration lifetime ..."

Meng Keong Lim et al. (2012)

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DOI: 10.1016/J.MICROREL.2011.12.026

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/LimLENWG12
Meng Keong Lim, Jingyuan Lin, Yong Chiang Ee, Chee Mang Ng, Jun Wei, Chee Lip Gan:
Experimental characterization and modelling of electromigration lifetime under unipolar pulsed current stress. Microelectron. Reliab. 52(8): 1553-1558 (2012)

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