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"Investigation on the thermal behavior of 0.15 μm gate-length ..."
Che-Kai Lin et al. (2012)
- Che-Kai Lin, Hsien-Chin Chiu, Chao-Wei Lin, Hsuan-Ling Kao, Feng-Tso Chien:
Investigation on the thermal behavior of 0.15 μm gate-length In0.4Al0.6As/In0.4Ga0.6As MHEMT. Microelectron. Reliab. 52(6): 969-973 (2012)
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