![](https://dblp.org/img/logo.ua.320x120.png)
![](https://dblp.org/img/dropdown.dark.16x16.png)
![](https://dblp.org/img/peace.dark.16x16.png)
Остановите войну!
for scientists:
![search dblp search dblp](https://dblp.org/img/search.dark.16x16.png)
![search dblp](https://dblp.org/img/search.dark.16x16.png)
default search action
"Characterisation of defects generated during constant current ..."
Riko I. Made et al. (2017)
- Riko I. Made
, Yu Gao, Govindo J. Syaranamual, Wardhana A. Sasangka, L. Zhang, Xuan Sang Nguyen
, Y. Y. Tay
, Jason Scott Herrin, Carl V. Thompson, Chee Lip Gan
:
Characterisation of defects generated during constant current InGaN-on-silicon LED operation. Microelectron. Reliab. 76-77: 561-565 (2017)
![](https://dblp.org/img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.