"An approach to adjust the board-level drop test conditions to improve the ..."

Toni T. Mattila et al. (2014)

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DOI: 10.1016/J.MICROREL.2013.11.017

access: closed

type: Journal Article

metadata version: 2020-02-22

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Toni T. Mattila, Heikki Ruotoistenmäki, Jani Raami, Jussi Hokka, Manu Mäkelä, Esa Hussa, Markku Sillanpää, Ville Halkola:
An approach to adjust the board-level drop test conditions to improve the correlation with product-level drop impact. Microelectron. Reliab. 54(4): 785-795 (2014)

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