"Gate oxide degradation of SiC MOSFET under short-circuit aging tests."

Safa Mbarek et al. (2016)

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DOI: 10.1016/J.MICROREL.2016.07.132

access: closed

type: Journal Article

metadata version: 2022-03-23

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Safa Mbarek, François Fouquet, Pascal Dherbécourt, Mohamed Masmoudi, Olivier Latry:
Gate oxide degradation of SiC MOSFET under short-circuit aging tests. Microelectron. Reliab. 64: 415-418 (2016)

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