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"Backside Failure Analysis of GaAs ICs after ESD tests."
Gaudenzio Meneghesso et al. (2002)
- Gaudenzio Meneghesso, A. Cocco, Giovanna Mura
, Simona Podda, Massimo Vanzi:
Backside Failure Analysis of GaAs ICs after ESD tests. Microelectron. Reliab. 42(9-11): 1293-1298 (2002)
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