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"Reliability and defectivity comparison of n- and p-channel SLS ELA ..."

Despina C. Moschou et al. (2008)

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DOI: 10.1016/J.MICROREL.2008.06.006

access: closed

type: Journal Article

metadata version: 2022-10-02

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Despina C. Moschou, M. A. Exarchos, Dimitrios N. Kouvatsos, George J. Papaioannou, Aggeliki Arapoyanni, Apostolos T. Voutsas:
Reliability and defectivity comparison of n- and p-channel SLS ELA polysilicon TFTs fabricated with a novel crystallization technique. Microelectron. Reliab. 48(8-9): 1544-1548 (2008)

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