"Influence of gate oxides with high thermal conductivity on the failure ..."

Felix Palumbo, Salvatore Lombardo, Moshe Eizenberg (2016)

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DOI: 10.1016/J.MICROREL.2015.10.009

access: closed

type: Journal Article

metadata version: 2024-10-06

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Felix Palumbo, Salvatore Lombardo, Moshe Eizenberg:
Influence of gate oxides with high thermal conductivity on the failure distribution of InGaAs-based MOS stacks. Microelectron. Reliab. 56: 22-28 (2016)

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