Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Commercial-off-the-shelf algan/gan hemt device reliability study after ..."

B. S. Poling et al. (2017)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2016.09.017

access: closed

type: Journal Article

metadata version: 2020-07-01

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/PolingVBJM17
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/PolingVBJM17
B. S. Poling, Glen David Via, K. D. Bole, E. E. Johnson, J. M. McDermott:
Commercial-off-the-shelf algan/gan hemt device reliability study after exposure to heavy ion radiation. Microelectron. Reliab. 68: 13-20 (2017)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.