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"Local current fluctuations before and after breakdown of thin ..."
Marc Porti et al. (2001)
- Marc Porti
, X. Blasco, Montserrat Nafría
, Xavier Aymerich
, Alexander Olbrich, Bernd Ebersberger:
Local current fluctuations before and after breakdown of thin SiO2 films observed with conductive atomic force microscope. Microelectron. Reliab. 41(7): 1041-1044 (2001)
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