"Exploring the thermal limit of GaN power devices under extreme overload ..."

Florian Peter Pribahsnik et al. (2017)

Details and statistics

DOI: 10.1016/J.MICROREL.2017.07.046

access: closed

type: Journal Article

metadata version: 2024-05-07

a service of  Schloss Dagstuhl - Leibniz Center for Informatics