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2020 – today
- 2024
[j13]Olena Yurchenko, Patrick Diehle
, Frank Altmann, Katrin Schmitt, Jürgen Wöllenstein:
Co3O4-Based Materials as Potential Catalysts for Methane Detection in Catalytic Gas Sensors. Sensors 24(8): 2599 (2024)- 2023
- [c6]Xhani Marvin Saß, Thilo Krachenfels, Frederik Dermot Pustelnik, Jean-Pierre Seifert, Frank Altmann:
Modulation to the Rescue: Identifying Sub-Circuitry in the Transistor Morass for Targeted Analysis. ASHES@CCS 2023: 113-122 - [i1]Xhani Marvin Saß, Thilo Krachenfels, Frederik Dermot Pustelnik, Jean-Pierre Seifert, Christian Große, Frank Altmann:
Modulation to the Rescue: Identifying Sub-Circuitry in the Transistor Morass for Targeted Analysis. CoRR abs/2309.09782 (2023) - 2021
- [c5]Michael Kögel, Sebastian Brand, Christian Große, Kristof J. P. Jacobs, Ingrid De Wolf, Frank Altmann:
Thermal source separation for 3D defect localization using independent component analysis (ICA) from time-resolved temperature response (TRTR). CASE 2021: 395-400 - [c4]Ilia Polian, Frank Altmann, Tolga Arul, Christian Boit, Ralf Brederlow, Lucas Davi, Rolf Drechsler, Nan Du, Thomas Eisenbarth, Tim Güneysu, Sascha Hermann, Matthias Hiller, Rainer Leupers, Farhad Merchant, Thomas Mussenbrock, Stefan Katzenbeisser, Akash Kumar, Wolfgang Kunz, Thomas Mikolajick, Vivek Pachauri, Jean-Pierre Seifert, Frank Sill Torres, Jens Trommer:
Nano Security: From Nano-Electronics to Secure Systems. DATE 2021: 1334-1339 - 2020
- [c3]Enrico Zanoni, Matteo Meneghini, Gaudenzio Meneghesso, Fabiana Rampazzo, Daniele Marcon, Veronica Gao Zhan, Francesca Chiocchetta, Andreas Graff, Frank Altmann, Michél Simon-Najasek, David Poppitz:
Reliability Physics of GaN HEMT Microwave Devices: The Age of Scaling. IRPS 2020: 1-10
2010 – 2019
- 2019
- [c2]Norbert Herfurth, Anne Beyreuther, Elham Amini, Christian Boit, Michél Simon-Najasek, Susanne Hübner, Frank Altmann, R. Herfurth, Chen Wu, Ingrid De Wolf, Kris Croes:
New Access to Soft Breakdown Parameters of Low-k Dielectrics Through Localisation-Based Analysis. IRPS 2019: 1-9 - 2018
- [c1]Andreas Graff, Michél Simon-Najasek, David Poppitz, Frank Altmann:
Physical failure analysis methods for wide band gap semiconductor devices. IRPS 2018: 3 - 2017
- [j12]Florian Peter Pribahsnik, Michael Nelhiebel, M. Mataln, Mirko Bernardoni, G. Prechtl, Frank Altmann, David Poppitz, A. Lindemann:
Exploring the thermal limit of GaN power devices under extreme overload conditions. Microelectron. Reliab. 76-77: 304-308 (2017) - [j11]Andreas Graff, Michél Simon-Najasek, Frank Altmann, Ján Kuzmík, Dagmar Gregusová, S. Hascik, Helmut Jung, T. Baur, Jan Grünenpütt, Hervé Blanck:
High resolution physical analysis of ohmic contact formation at GaN-HEMT devices. Microelectron. Reliab. 76-77: 338-343 (2017) - 2016
- [j10]Frank Altmann, Matthias Petzold:
Innovative Failure Analysis Techniques for 3-D Packaging Developments. IEEE Des. Test 33(3): 46-55 (2016) - [j9]Michél Simon-Najasek, Georg Lorenz, Achim Lindner, Frank Altmann:
Novel failure mode of chip corrosion at automotive HALL sensor devices under multiple stress conditions. Microelectron. Reliab. 64: 248-253 (2016) - [j8]Falk Naumann, Volkmar Gottschalk, Bernd Burchard, Frank Altmann:
Reliability evaluation of Si-dies due to assembly issues. Microelectron. Reliab. 64: 266-269 (2016) - [j7]Sebastian Brand, Michél Simon-Najasek, Michael Kögel, Joerg Jatzkowski, R. Portius, Frank Altmann:
Detection and analysis of stress-induced voiding in Al-power lines by acoustic GHz-microscopy. Microelectron. Reliab. 64: 341-345 (2016) - [j6]Michael Kögel, Frank Altmann, Sebastian Tismer, Sebastian Brand:
Magnetic field and current density imaging using off-line lock-in analysis. Microelectron. Reliab. 64: 346-351 (2016) - [j5]Mikael Broas, Andreas Graff, Michél Simon-Najasek, David Poppitz, Frank Altmann, Helmut Jung, Hervé Blanck:
Correlation of gate leakage and local strain distribution in GaN/AlGaN HEMT structures. Microelectron. Reliab. 64: 541-546 (2016) - 2014
- [j4]Michél Simon-Najasek, Susanne Hübner, Frank Altmann, Andreas Graff:
Advanced FIB sample preparation techniques for high resolution TEM investigations of HEMT structures. Microelectron. Reliab. 54(9-10): 1785-1789 (2014) - 2012
- [j3]Joerg Jatzkowski, Michél Simon-Najasek, Frank Altmann:
Novel techniques for dopant contrast analysis on real IC structures. Microelectron. Reliab. 52(9-10): 2098-2103 (2012) - 2010
- [j2]Rudolf Schlangen, Hervé Deslandes, Ted R. Lundquist, C. Schmidt, Frank Altmann, K. Yu, A. Andreasyan, S. Li:
Dynamic lock-in thermography for operation mode-dependent thermally active fault localization. Microelectron. Reliab. 50(9-11): 1454-1458 (2010)
2000 – 2009
- 2006
- [j1]O. Breitenstein, Frank Altmann, Thorsten Riediger, D. Karg, V. Gottschalk:
Lock-in thermal IR imaging using a solid immersion lens. Microelectron. Reliab. 46(9-11): 1508-1513 (2006)
Coauthor Index
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