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"Performance and reliability trade-offs for high-κ RRAM."

Nagarajan Raghavan (2014)

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DOI: 10.1016/J.MICROREL.2014.07.135

access: closed

type: Journal Article

metadata version: 2023-03-21

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Nagarajan Raghavan:
Performance and reliability trade-offs for high-κ RRAM. Microelectron. Reliab. 54(9-10): 2253-2257 (2014)

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