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"Understanding the degradation processes of GaN based LEDs submitted to ..."

N. Renso et al. (2017)

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DOI: 10.1016/J.MICROREL.2017.06.044

access: closed

type: Journal Article

metadata version: 2024-05-07

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N. Renso, Matteo Meneghini, Matteo Buffolo, Carlo De Santi, Gaudenzio Meneghesso, Enrico Zanoni:
Understanding the degradation processes of GaN based LEDs submitted to extremely high current density. Microelectron. Reliab. 76-77: 556-560 (2017)

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