"Hot-Carrier Reliability for Si and SiGe HBTs: Aging Procedure, ..."

Nathalie Revil, Xavier Garros (2001)

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DOI: 10.1016/S0026-2714(01)00203-7

access: closed

type: Journal Article

metadata version: 2020-02-22

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Nathalie Revil, Xavier Garros:
Hot-Carrier Reliability for Si and SiGe HBTs: Aging Procedure, Extrapolation Model Limitations and Applications. Microelectron. Reliab. 41(9-10): 1307-1312 (2001)

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