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"Identification of the generation/rupture mechanism of filamentary ..."

Alberto Rodriguez-Fernandez et al. (2017)

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DOI: 10.1016/J.MICROREL.2017.06.088

access: closed

type: Journal Article

metadata version: 2021-09-25

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  - https://dblp.org/rec/journals/mr/Rodriguez-Fernandez17
Alberto Rodriguez-Fernandez, Carlo Cagli, Luca Perniola, Jordi Suñé, Enrique Miranda:
Identification of the generation/rupture mechanism of filamentary conductive paths in ReRAM devices using oxide failure analysis. Microelectron. Reliab. 76-77: 178-183 (2017)

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