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"Field returns, a source of natural failure mechanisms."

William J. Roesch, Steve Brockett (2007)

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DOI: 10.1016/J.MICROREL.2007.02.004

access: closed

type: Journal Article

metadata version: 2020-02-22

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William J. Roesch, Steve Brockett:
Field returns, a source of natural failure mechanisms. Microelectron. Reliab. 47(8): 1156-1165 (2007)

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