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"Trap generation and breakdown processes in very thin gate oxides."

Elyse Rosenbaum, Jie Wu (2001)

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DOI: 10.1016/S0026-2714(01)00026-9

access: closed

type: Journal Article

metadata version: 2020-02-22

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Elyse Rosenbaum, Jie Wu:
Trap generation and breakdown processes in very thin gate oxides. Microelectron. Reliab. 41(5): 625-632 (2001)

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