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"Experimental investigation on the impact of stress free temperature on the ..."
Arijit Roy, Cher Ming Tan (2006)
- Arijit Roy, Cher Ming Tan:
Experimental investigation on the impact of stress free temperature on the electromigration performance of copper dual damascene submicron interconnect. Microelectron. Reliab. 46(9-11): 1652-1656 (2006)
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