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"ESD failure signature in capacitive RF MEMS switches."

Jinyu Jason Ruan et al. (2008)

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DOI: 10.1016/J.MICROREL.2008.06.035

access: closed

type: Journal Article

metadata version: 2024-08-04

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Jinyu Jason Ruan, George J. Papaioannou, Nicolas Nolhier, Nicolas Mauran, Marise Bafleur, Fabio Coccetti, Robert Plana:
ESD failure signature in capacitive RF MEMS switches. Microelectron. Reliab. 48(8-9): 1237-1240 (2008)

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