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"The temperature dependence of mixed mode degradation in bipolar transistors."

Guido T. Sasse, Martin Combrié (2012)

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DOI: 10.1016/J.MICROREL.2012.06.020

access: closed

type: Journal Article

metadata version: 2022-02-04

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Guido T. Sasse, Martin Combrié:
The temperature dependence of mixed mode degradation in bipolar transistors. Microelectron. Reliab. 52(9-10): 1913-1917 (2012)

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