"Quantifying charging damage in gate oxides of antenna structures for WLR ..."

David Smeets, Josef Fazekas (2004)

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DOI: 10.1016/J.MICROREL.2004.04.010

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type: Journal Article

metadata version: 2020-02-22

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David Smeets, Josef Fazekas:
Quantifying charging damage in gate oxides of antenna structures for WLR monitoring. Microelectron. Reliab. 44(8): 1245-1250 (2004)

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