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"Testing Static Random Access Memories: Defects, Fault Models and Test ..."

Mile K. Stojcev (2005)

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DOI: 10.1016/J.MICROREL.2004.11.003

access: closed

type: Journal Article

metadata version: 2020-02-22

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Mile K. Stojcev:
Testing Static Random Access Memories: Defects, Fault Models and Test Patterns, Said Hamdioui, Kluwer Academic Publishers, Boston, 2004, Hardcover, pp 221, plus XX, ISBN 1-4020-7752-1. Microelectron. Reliab. 45(5-6): 1012-1013 (2005)

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