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"Similarity approach for reducing qualification tests of electronic components."
Stoyan Stoyanov, Chris Bailey, Georgios Tourloukis (2016)
- Stoyan Stoyanov
, Chris Bailey
, Georgios Tourloukis:
Similarity approach for reducing qualification tests of electronic components. Microelectron. Reliab. 67: 111-119 (2016)
![](https://dblp.org/img/cog.dark.24x24.png)
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