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"Scanning Thermal Microscopy in Microsystem Reliability Analysis."

R. F. Szeloch, Teodor P. Gotszalk, Pawel Janus (2002)

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DOI: 10.1016/S0026-2714(02)00219-6

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/SzelochGJ02
R. F. Szeloch, Teodor P. Gotszalk, Pawel Janus:
Scanning Thermal Microscopy in Microsystem Reliability Analysis. Microelectron. Reliab. 42(9-11): 1719-1722 (2002)

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