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"Improved performance of GeON as charge storage layer in flash memory by ..."

Q. B. Tao, P. T. Lai (2012)

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DOI: 10.1016/J.MICROREL.2012.06.112

access: closed

type: Journal Article

metadata version: 2020-02-22

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Q. B. Tao, P. T. Lai:
Improved performance of GeON as charge storage layer in flash memory by optimal annealing. Microelectron. Reliab. 52(11): 2597-2601 (2012)

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