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"RF modeling approach to determining end-of-life reliability for InP-based ..."

Stephen Thomas III, Charles H. Fields, Meena Madhav (2001)

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DOI: 10.1016/S0026-2714(01)00085-3

access: closed

type: Journal Article

metadata version: 2024-01-08

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Stephen Thomas III, Charles H. Fields, Meena Madhav:
RF modeling approach to determining end-of-life reliability for InP-based HBTs. Microelectron. Reliab. 41(8): 1129-1135 (2001)

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