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"Reliable study of time- and frequency-domain EMI-induced noise in Wien ..."

Han-Chang Tsai (2012)

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DOI: 10.1016/J.MICROREL.2012.04.015

access: closed

type: Journal Article

metadata version: 2020-02-22

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Han-Chang Tsai:
Reliable study of time- and frequency-domain EMI-induced noise in Wien bridge oscillator. Microelectron. Reliab. 52(11): 2647-2654 (2012)

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