"Relevant metrics for evaluation of concurrent error detection schemes."

Maí Correia R. de Vasconcelos et al. (2008)

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DOI: 10.1016/J.MICROREL.2008.07.016

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type: Journal Article

metadata version: 2022-10-02

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Maí Correia R. de Vasconcelos, Denis Teixeira Franco, Lirida A. B. Naviner, Jean-François Naviner:
Relevant metrics for evaluation of concurrent error detection schemes. Microelectron. Reliab. 48(8-9): 1601-1603 (2008)

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