"Reliability of Medium Blocking Voltage Power VDMOSFET in Radiation ..."

Francesco Velardi et al. (2003)

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DOI: 10.1016/S0026-2714(03)00314-7

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type: Journal Article

metadata version: 2024-10-06

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Francesco Velardi, Francesco Iannuzzo, Giovanni Busatto, Jeffery Wyss, Annunziata Sanseverino, A. Candelori, Giuseppe Currò, Alessandra Cascio, Ferruccio Frisina:
Reliability of Medium Blocking Voltage Power VDMOSFET in Radiation Environment. Microelectron. Reliab. 43(9-11): 1847-1851 (2003)

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