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"SEU reduction effectiveness of common centroid layout in differential ..."

Haibin Wang et al. (2017)

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DOI: 10.1016/J.MICROREL.2017.04.003

access: closed

type: Journal Article

metadata version: 2022-10-26

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Haibin Wang, Ao Sheng, Shiqi Wang, Jinshun Bi, Li Chen, Xiaofeng Liu:
SEU reduction effectiveness of common centroid layout in differential latch at 130-nm CMOS technology. Microelectron. Reliab. 72: 39-44 (2017)

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