"Mechanical stress effects on electrical breakdown of freestanding GaN thin ..."

Tun Wang et al. (2018)

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DOI: 10.1016/J.MICROREL.2017.12.033

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type: Journal Article

metadata version: 2025-01-16

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Tun Wang, Baoming Wang, M. Aman Haque, Michael Snure, Eric Heller, Nicholas Glavin:
Mechanical stress effects on electrical breakdown of freestanding GaN thin films. Microelectron. Reliab. 81: 181-185 (2018)

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