"Degradation behavior and mechanism of polymer films for high-ohmic ..."

X. Y. Wang et al. (2016)

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DOI: 10.1016/J.MICROREL.2015.12.005

access: closed

type: Journal Article

metadata version: 2020-02-22

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X. Y. Wang, H. Zhang, X. P. Ma, Q. Cheng, C. G. Li, M. X. Li, T. N. Chen, P. Zhang, J. Q. Shao:
Degradation behavior and mechanism of polymer films for high-ohmic resistor protection in a heat and humid environment. Microelectron. Reliab. 57: 79-85 (2016)

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