"A power cycling degradation inspector of power semiconductor devices."

Akihiko Watanabe, Ichiro Omura (2018)

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DOI: 10.1016/J.MICROREL.2018.06.071

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type: Journal Article

metadata version: 2025-01-19

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Akihiko Watanabe, Ichiro Omura:
A power cycling degradation inspector of power semiconductor devices. Microelectron. Reliab. 88-90: 458-461 (2018)

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