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"Identification and analysis of power substrates degradations subjected to ..."

Eric Woirgard et al. (2015)

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DOI: 10.1016/J.MICROREL.2015.06.048

access: closed

type: Journal Article

metadata version: 2023-03-21

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Eric Woirgard, Faical Arabi, Wissam Sabbah, Donatien Martineau, L. Théolier, Stephane Azzopardi:
Identification and analysis of power substrates degradations subjected to severe aging tests. Microelectron. Reliab. 55(9-10): 1961-1965 (2015)

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