![](https://dblp.org/img/logo.ua.320x120.png)
![](https://dblp.org/img/dropdown.dark.16x16.png)
![](https://dblp.org/img/peace.dark.16x16.png)
Остановите войну!
for scientists:
![search dblp search dblp](https://dblp.org/img/search.dark.16x16.png)
![search dblp](https://dblp.org/img/search.dark.16x16.png)
default search action
"Front-end of line and middle-of-line time-dependent dielectric breakdown ..."
Kexin Yang et al. (2017)
- Kexin Yang, Taizhi Liu, Rui Zhang, Dae Hyun Kim
, Linda Milor
:
Front-end of line and middle-of-line time-dependent dielectric breakdown reliability simulator for logic circuits. Microelectron. Reliab. 76-77: 81-86 (2017)
![](https://dblp.org/img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.