"The influence of microwave pulse width on the thermal burnout effect of a ..."

Shipeng Yi, Zhengwei Du (2017)

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DOI: 10.1016/J.MICROREL.2017.06.025

access: closed

type: Journal Article

metadata version: 2020-02-22

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Shipeng Yi, Zhengwei Du:
The influence of microwave pulse width on the thermal burnout effect of a PIN diode limiting-amplifying system. Microelectron. Reliab. 75: 102-109 (2017)

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