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"A closed-form trapped-charge-included drain current compact model for ..."

Fei Yu et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.02.004

access: closed

type: Journal Article

metadata version: 2020-02-22

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Fei Yu, Chuanzhong Xu, Gongyi Huang, Wei Lin, Tsair-Chun Liang:
A closed-form trapped-charge-included drain current compact model for amorphous oxide semiconductor thin-film transistors. Microelectron. Reliab. 91: 307-312 (2018)

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