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"Test generation for technology-specific multi-faults based on detectable ..."

Andrej Zemva, Baldomir Zajc (2005)

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DOI: 10.1016/J.MICROREL.2004.04.025

access: closed

type: Journal Article

metadata version: 2020-02-22

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Andrej Zemva, Baldomir Zajc:
Test generation for technology-specific multi-faults based on detectable perturbations. Microelectron. Reliab. 45(1): 163-173 (2005)

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